Defect Detection Demonstration

Embedded Vision Solution to Detect Defects

Unlock new levels of quality assurance with the Lattice sensAI™ Defect detection solution —enabling real-time detection and classification of defects in manufacturing, assembly, and inspection processes. This demonstration showcases how Lattice FPGAs and sensAI software deliver robust, low-power vision intelligence for industrial automation and quality control.

The demo leverages advanced computer vision models to:

  • Detect surface defects, cracks, scratches, and anomalies on products or components
  • Classify defect types and severity in real time
  • Output annotated video streams with defect locations and labels
  • Run efficiently on Lattice FPGAs, with video and metadata streamed to a host processor via MIPI and I2C
  • Visualize results in HUB software on the processor
  • Compatible with CrossLink-NX and CertusPro-NX SOM boards.

Features

  • Instantly identify and classify defects, enabling rapid response and corrective action
  • Efficient AI models optimized for edge devices, supporting continuous inspection
  • Supports a wide range of defect types and deployment scenarios
  • Easily connects to existing inspection systems and legacy infrastructure
  • Accurate detection for improved product quality and reduced waste

框图

具有预测性维护功能的多通道马达控制演示框图

Documentation

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Defect Detection Reference Design and Demonstration Documentation
To learn more about this product design and to access the complete source code, bitstream and user guide in GitHub, please click here
1/18/2026 WEB