FIT rate for Lattice device in included in Reliability report which consists of other test result.
https://www.latticesemi.com/Support/QualityAndReliabilityFailure rates in this reliability report are expressed in FITS. Due to the very low failure rate of integrated circuits, it is convenient to refer to failures in a population during a period of 10^9 device hours; one failure in 10^9 device hours are defined as one FIT.