November 2008

Lattice Reliability Monitor Report

The reliability of semiconductor devices has contributed to the electronic revolution we live with today. Devices based on solid state circuits routinely last for decades. The failure rates of semiconductor devices are typically measured in FITs (Failures In Time) per billions of device operating hours. This level of performance has become an expectation for end customers of semiconductor devices. 

Reliability Monitor Program

Lattice maintains a Reliability Monitor Program to test the reliability of our outgoing products. This program monitors all of our wafer foundry technologies, our assembly and packaging technologies, and the process controls in place to ensure the reliability of our end products is uncompromised. 

A Reliability Monitor Report is published quarterly, detailing the reliability monitor activities and results. The most recent edition, the Product Reliability Monitor Report Q3 2008, is now available.

To Learn More 

For further information about product quality and reliability at Lattice, go to the Quality, Reliability and Environmental Information page of the Lattice website and select your topics of interest